By Edited by M. H. Brodsky
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Additional info for Amorphous Semiconductors, 2nd Edition (Topics in applied physics, vol. 36)
343 Subject Index . . . . . . . . . . . . . . . . . . 371 Contents – Volume IV 23 Scanning Probe Lithography for Chemical, Biological and Engineering Applications Joseph M. Kinsella, Albena Ivanisevic . . . . . . . . 1 Nanotribological Characterization of Human Hair and Skin Using Atomic Force Microscopy (AFM) Bharat Bhushan, Carmen LaTorre . . . . . . . . . 35 Nanofabrication with Self-Assembled Monolayers by Scanning Probe Lithography Jayne C. Garno, James D.
283 8 9 10 Polarization-Modulation Techniques in Near-Field Optical Microscopy for Imaging of Polarization Anisotropy in Photonic Nanostructures Pietro Giuseppe Gucciardi, Ruggero Micheletto, Yoichi Kawakami, Maria Allegrini . . . . . . . . . . . . . . . 321 XXXIV 11 Contents – Volume II Focused Ion Beam as a Scanning Probe: Methods and Applications Vittoria Raffa, Piero Castrataro, Arianna Menciassi, Paolo Dario . 361 Subject Index . . . . . . . . . . . . .
149 Combined Scanning Probe Techniques for In-Situ Electrochemical Imaging at a Nanoscale Justyna Wiedemair, Boris Mizaikoff, Christine Kranz . . . . 225 New AFM Developments to Study Elasticity and Adhesion at the Nanoscale Robert Szoszkiewicz, Elisa Riedo . . . . . . . . . . 269 Near-Field Raman Spectroscopy and Imaging Pietro Giuseppe Gucciardi, Sebastiano Trusso, Cirino Vasi, Salvatore Patanè, Maria Allegrini . . . . . . . . . . 287 Subject Index . . . . . . . .
Amorphous Semiconductors, 2nd Edition (Topics in applied physics, vol. 36) by Edited by M. H. Brodsky